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Selected reading material
Quality, reliability and statistics

Title Integrated Circuit Failure Analysis: A Guide to Preparation Technique
Author Friedrich Beck
ISBN 0471974013
Publisher John Wiley, Chichester
Date 1998
Description Based on author’s experience at Siemens, Munich. Practical guide; well illustrated; contains hazards and suppliers lists.
Title ESD Program Management: 2nd edn
Author G Theodore (Ted) Dangelmayer
ISBN 0412136716
Publisher Kluwer Academic Publishers
Date 1999
Description 1st edition was called A Realistic Approach to Continuous Measurable Improvement in Static Control, and this remains the emphasis.
Title Rating and Uprating of Electronic Products
Author Diganta Das, Michael Pecht and Neeraj Pendse
ISBN 0970717423
Publisher CALCE EPSC Press
Date 2004
Description The aim of the book is to give the reader a well-defined, risk-informed methodology which will enable one to determine whether an electronics part will meet the performance requirements when used outside the manufacturer specified ratings, as listed in the part datasheet.
Title Integrated circuit quality and reliability, 2nd edn
Author Eugene R Hnatek
ISBN 0824792831
Publisher Marcel Dekker, New York
Date 1995
Description Covers manufacturing, assembly and test in some detail before looking at causes of failure in materials and processes.
Title Accelerated reliability engineering: HALT and HASS
Author Gregg K Hobbs
ISBN 047197966X
Publisher John Wiley & Sons, New York
Date 2000
Description With emphasis on HALT (highly accelerated life testing) and HASS (highly accelerated stress screening) techniques, this book describes environmental stress screening techniques applied in the design phase in order to force failures that would otherwise appear later in the product’s life.
Title Juran’s Quality Handbook, 5th edn
Author A Blanton Godfrey and J M Juran
ISBN 007034003X
Publisher McGraw-Hill
Date 1998
Description Covers general management issues as well as its main thrust of quality improvement based around Juran’s model of the trilogy of processes – quality planning, quality control, and quality results – that underlie management for quality.

“This book is massive, covers every aspect of quality engineering and management and is highly recommended” and contains “all the tools you could ever need to analyse problems and, most importantly, develop solutions”.
Title Quality Planning and Analysis: from product development through use, 4th edn
Author Frank M Gryna
ISBN 0070393680
Publisher McGraw Hill, New York
Date 2000
Description Comprehensive coverage of quality control principles and techniques, with not overly technical treatment. Earlier editions were co-authored by J. M. Juran: this updated edition includes issues such as electronic commerce, outsourcing, balanced scorecard, quality function deployment, project management, learning organization and supply chain management.
Title Electronic Failure Analysis Handbook: Techniques and Applications for Electronic and Electrical Packages, Components and Assemblies
Author ed. Perry L Martin
ISBN 0070410445
Publisher McGraw-Hill, New York
Date 1999
Description Drawing on a number of case studies, this book examines how EFA techniques are used by suppliers, designers and fabricators to limit systems and device malfunction. Major sections on techniques and the failure analysis of specific technologies.
Reviewed at http://www.smartgroup.org/books/efah.htm.
Title Statistical Process Control for Surface Mount Technology
Author William S Messina
ISBN 0967503396
Publisher Data Sleuths, USA
Date 1999
Description  
Title Applied statistics and probability for engineers: 2006 edn
Author Douglas C Montgomery and George C Runger
ISBN 0471735566
Publisher John Wiley & Sons, New York
Date 2005
Description “Easy to follow” book on statistical tools, including design of experiments and SPC, which is reported to be “ideal for those looking to improve or measure a process”. Examples and exercises are engineering-based, containing real data.
Title Statistical Process Control – A Really Practical Guide, 3rd edn
Author John S Oakland
ISBN Butterworth Heinemann
Publisher 0750644397
Date 1999
Description A significant reworking of the earlier version. Presents the foundations of good quality management and process control, including an explanation of what quality is, and control of conformance and consistency during production.

“Great for the newcomer to SPC in industry or management . . . simple language, minimising the use of formulae and mathematical proofs, with the added advantage of using examples that the reader can relate to. No prior knowledge of statistics is required.”
Title Quality Conformance and Qualification of Microelectronic Packages and Interconnects
Author ed. Michael G Pecht, Abhijit Dasgupta, John W Evans and Jillian Y Evans
ISBN 0471594369
Publisher Wiley Inter-Science, New York
Date 1995
Description Written with a different set of collaborators, and focusing on quality and reliability issues, this is not as successful as Pecht 1995. One gets the feeling that a common ‘prescription’ was followed in writing each chapter, to the detriment of depth of coverage of the topic. Harman 1989 has a much more useful in depth discussion of reliability and quality problems relating to wire bonding. Nevertheless, the sections on hermetic package failures are not easy to come by from other sources.
Title Integrated circuit, hybrid, and multi-chip module package design guidelines: a focus on reliability
Author ed. Michael G Pecht
ISBN 0471594466
Publisher Wiley Inter-Science, New York
Date 1994
Description The material in this book has obvious connections with the book on Quality Conformance and Qualification, combining material from a range of collaborators, and using a similar ‘prescription’ in arranging the material. More useful, in that the processes are better described.
Title Taguchi Techniques for Quality Engineering: Loss Function, Orthogonal Experiments, Parameter and Tolerance Design: 2nd edn
Author Philip J Ross
ISBN 0070539588
Publisher McGraw-Hill Education
Date 1995
Description Ross discusses Taguchi methodology in a practical way, keeping formal statistics to a minimum. There are many tables which can be used, although care should be taken not to use this as a ‘cook book’.
Title Electrostatic Discharge Protection for Electronics
Author Neil Sclater
ISBN 0380683291
Publisher TPR Books (McGraw-Hill), Blue Ridge Summit PA
Date 1990
Description Practical advice on selecting test and control equipment, handling and storing semiconductors and other components, building static-free workstations, and creating a protective environment.
Title Six Sigma for Electronics Design & Manufacturing
Author Sammy G Shina
ISBN 0071395113
Publisher McGraw-Hill Education
Date 2002
Description Reviewed at http://www.smartgroup.org/books/six.htm

 

Title Failure modes and mechanisms in electronic packages
Author Puligandla Viswanadham and Pratap Singh
ISBN 0412105918
Publisher Chapman & Hall, New York
Date 1998
Description Details processes that enable detection, analysis and the prevention of failures, and provides a comprehensive account of the failures of device packages, discrete component connectors, PCB carriers, and PCB assemblies.

A up-to-date compendium of failure mechanisms, which is well-assembled, and used by SAMC as a set text for reliability courses.
Title Statistics
Author James A Walker , Margaret M McLean, James W Matthew
ISBN 0340552468
Publisher Hodder & Stoughton Educational
Date 1993
Description Encourages readers to look critically at the way statistics are used in the media and in everyday language. Includes exercises to encourage practical application of statistical techniques.
Title The principles and practice of electron microscopy, 2nd edn
Author Ian M Watt
ISBN 0521435919
Publisher Cambridge University Press
Date 1997
Description Comprehensive and well illustrated , with case studies.

 

 

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