| Title | Integrated Circuit Failure Analysis: A Guide to Preparation Technique |
|---|---|
| Author | Friedrich Beck |
| ISBN | 0471974013 |
| Publisher | John Wiley, Chichester |
| Date | 1998 |
| Description | Based on author’s experience at Siemens, Munich. Practical guide; well illustrated; contains hazards and suppliers lists. |
| Title | ESD Program Management: 2nd edn |
|---|---|
| Author | G Theodore (Ted) Dangelmayer |
| ISBN | 0412136716 |
| Publisher | Kluwer Academic Publishers |
| Date | 1999 |
| Description | 1st edition was called A Realistic Approach to Continuous Measurable Improvement in Static Control, and this remains the emphasis. |
| Title | Rating and Uprating of Electronic Products |
|---|---|
| Author | Diganta Das, Michael Pecht and Neeraj Pendse |
| ISBN | 0970717423 |
| Publisher | CALCE EPSC Press |
| Date | 2004 |
| Description | The aim of the book is to give the reader a well-defined, risk-informed methodology which will enable one to determine whether an electronics part will meet the performance requirements when used outside the manufacturer specified ratings, as listed in the part datasheet. |
| Title | Integrated circuit quality and reliability, 2nd edn |
|---|---|
| Author | Eugene R Hnatek |
| ISBN | 0824792831 |
| Publisher | Marcel Dekker, New York |
| Date | 1995 |
| Description | Covers manufacturing, assembly and test in some detail before looking at causes of failure in materials and processes. |
| Title | Accelerated reliability engineering: HALT and HASS |
|---|---|
| Author | Gregg K Hobbs |
| ISBN | 047197966X |
| Publisher | John Wiley & Sons, New York |
| Date | 2000 |
| Description | With emphasis on HALT (highly accelerated life testing) and HASS (highly accelerated stress screening) techniques, this book describes environmental stress screening techniques applied in the design phase in order to force failures that would otherwise appear later in the product’s life. |
| Title | Juran’s Quality Handbook, 5th edn |
|---|---|
| Author | A Blanton Godfrey and J M Juran |
| ISBN | 007034003X |
| Publisher | McGraw-Hill |
| Date | 1998 |
| Description | Covers general management issues as well as its main thrust of quality improvement based around Juran’s model of the trilogy of processes – quality planning, quality control, and quality results – that underlie management for quality. “This book is massive, covers every aspect of quality engineering and management and is highly recommended” and contains “all the tools you could ever need to analyse problems and, most importantly, develop solutions”. |
| Title | Quality Planning and Analysis: from product development through use, 4th edn |
|---|---|
| Author | Frank M Gryna |
| ISBN | 0070393680 |
| Publisher | McGraw Hill, New York |
| Date | 2000 |
| Description | Comprehensive coverage of quality control principles and techniques, with not overly technical treatment. Earlier editions were co-authored by J. M. Juran: this updated edition includes issues such as electronic commerce, outsourcing, balanced scorecard, quality function deployment, project management, learning organization and supply chain management. |
| Title | Electronic Failure Analysis Handbook: Techniques and Applications for Electronic and Electrical Packages, Components and Assemblies |
|---|---|
| Author | ed. Perry L Martin |
| ISBN | 0070410445 |
| Publisher | McGraw-Hill, New York |
| Date | 1999 |
| Description | Drawing on a number of case studies, this book examines how EFA techniques are used by suppliers, designers and fabricators to limit systems and device malfunction. Major sections on techniques and the failure analysis of specific technologies. Reviewed at http://www.smartgroup.org/books/efah.htm. |
| Title | Statistical Process Control for Surface Mount Technology |
|---|---|
| Author | William S Messina |
| ISBN | 0967503396 |
| Publisher | Data Sleuths, USA |
| Date | 1999 |
| Description |
| Title | Applied statistics and probability for engineers: 2006 edn |
|---|---|
| Author | Douglas C Montgomery and George C Runger |
| ISBN | 0471735566 |
| Publisher | John Wiley & Sons, New York |
| Date | 2005 |
| Description | “Easy to follow” book on statistical tools, including design of experiments and SPC, which is reported to be “ideal for those looking to improve or measure a process”. Examples and exercises are engineering-based, containing real data. |
| Title | †Statistical Process Control – A Really Practical Guide, 3rd edn |
|---|---|
| Author | John S Oakland |
| ISBN | Butterworth Heinemann |
| Publisher | 0750644397 |
| Date | 1999 |
| Description | A significant reworking of the earlier version. Presents the foundations of good quality management and process control, including an explanation of what quality is, and control of conformance and consistency during production. “Great for the newcomer to SPC in industry or management . . . simple language, minimising the use of formulae and mathematical proofs, with the added advantage of using examples that the reader can relate to. No prior knowledge of statistics is required.” |
| Title | Quality Conformance and Qualification of Microelectronic Packages and Interconnects |
|---|---|
| Author | ed. Michael G Pecht, Abhijit Dasgupta, John W Evans and Jillian Y Evans |
| ISBN | 0471594369 |
| Publisher | Wiley Inter-Science, New York |
| Date | 1995 |
| Description | Written with a different set of collaborators, and focusing on quality and reliability issues, this is not as successful as Pecht 1995. One gets the feeling that a common ‘prescription’ was followed in writing each chapter, to the detriment of depth of coverage of the topic. Harman 1989 has a much more useful in depth discussion of reliability and quality problems relating to wire bonding. Nevertheless, the sections on hermetic package failures are not easy to come by from other sources. |
| Title | Integrated circuit, hybrid, and multi-chip module package design guidelines: a focus on reliability |
|---|---|
| Author | ed. Michael G Pecht |
| ISBN | 0471594466 |
| Publisher | Wiley Inter-Science, New York |
| Date | 1994 |
| Description | The material in this book has obvious connections with the book on Quality Conformance and Qualification, combining material from a range of collaborators, and using a similar ‘prescription’ in arranging the material. More useful, in that the processes are better described. |
| Title | Taguchi Techniques for Quality Engineering: Loss Function, Orthogonal Experiments, Parameter and Tolerance Design: 2nd edn |
|---|---|
| Author | Philip J Ross |
| ISBN | 0070539588 |
| Publisher | McGraw-Hill Education |
| Date | 1995 |
| Description | Ross discusses Taguchi methodology in a practical way, keeping formal statistics to a minimum. There are many tables which can be used, although care should be taken not to use this as a ‘cook book’. |
| Title | †Electrostatic Discharge Protection for Electronics |
|---|---|
| Author | Neil Sclater |
| ISBN | 0380683291 |
| Publisher | TPR Books (McGraw-Hill), Blue Ridge Summit PA |
| Date | 1990 |
| Description | Practical advice on selecting test and control equipment, handling and storing semiconductors and other components, building static-free workstations, and creating a protective environment. |
| Title | Six Sigma for Electronics Design & Manufacturing |
|---|---|
| Author | Sammy G Shina |
| ISBN | 0071395113 |
| Publisher | McGraw-Hill Education |
| Date | 2002 |
| Description | Reviewed at http://www.smartgroup.org/books/six.htm |
| Title | Failure modes and mechanisms in electronic packages |
|---|---|
| Author | Puligandla Viswanadham and Pratap Singh |
| ISBN | 0412105918 |
| Publisher | Chapman & Hall, New York |
| Date | 1998 |
| Description | Details processes that enable detection, analysis and the prevention of failures, and provides a comprehensive account of the failures of device packages, discrete component connectors, PCB carriers, and PCB assemblies. A up-to-date compendium of failure mechanisms, which is well-assembled, and used by SAMC as a set text for reliability courses. |
| Title | Statistics |
|---|---|
| Author | James A Walker , Margaret M McLean, James W Matthew |
| ISBN | 0340552468 |
| Publisher | Hodder & Stoughton Educational |
| Date | 1993 |
| Description | Encourages readers to look critically at the way statistics are used in the media and in everyday language. Includes exercises to encourage practical application of statistical techniques. |
| Title | The principles and practice of electron microscopy, 2nd edn |
|---|---|
| Author | Ian M Watt |
| ISBN | 0521435919 |
| Publisher | Cambridge University Press |
| Date | 1997 |
| Description | Comprehensive and well illustrated , with case studies. |